Scientists Taught Fluorescent Microscope to Automatically Adapt to Any Sample
An international team of physicists found a new way to improve images obtained by fluorescence microscopy. The method is based on adaptive optics and implies an automatic correction of aberrations. Moreover, this correction is based on the quality of individual pixels, rather than the image as a whole. This helps avoid re-calibration of the microscope in case of changing the sample. As a result, microscopy can be significantly accelerated. The results are published in PLoS ONE.
“Previously, we described a metric that provides the fastest and most reliable wavefront estimation. It is based on second-moment luminescence and suits fluorescent microscopy well. Using it we can minimize the total number of measurements so as to avoid photo-bleaching,” says Oleg Soloviev, professor at Delft University of Technology and ITMO University.
“After theoretical calculations and modelling we tested our method in action, using two microscopes. The first was initially created on the principle of adaptive optics. The second was an ordinary microscope for student practice. We compared the quality of the images obtained on both microscopes and saw that our method was successful. Finally, we conducted a statistical analysis and validation of the method in comparison with the previously obtained data,” notes Paolo Pozzi, PhD, researcher at Delft University of Technology.
“We made the system that improves image overall quality. However, the problem is that we applied the same correction everywhere in the field of view. Now we are working on a technology that will help to adjust defects in individual regions of the image and therefore reach higher resolution,” adds Pozzi.